ITC 2005 - Call for Papers: Lecture Series

CALL FOR PAPERS
Lecture Series and Application Series

Overview

International Test Conference is the world's premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

This year, ITC will focus on evolutionary as well as revolutionary trends in test technology. Evolving new "out-of-the-box" ideas to meet the tough test challenges presented by very-deep-submicron technologies and the competition for dominance among alternative solutions. Recent advances in areas such as on-chip compression, low-cost test, and test data analysis have burst onto the scene and are being rapidly and widely adopted.

Submissions for the Lecture Series should emphasize topics are new and at the leading edge of technology—currently topical or heavily debated topics that are important to the testing industry. The purpose of the Application Series is to cover test application topics using an embedded tutorial format. The topics presented should be based on experience and should provide a practical coverage of the topic. Participation is encouraged from individuals who have a practical knowledge of the topic based on experience.

Possible Lecture and Application Series Topic Areas:

BIST or Embedded Test for Chip and Board
Board and System Test
Loadboard Design and Tester Interfacing
Simulation and Test
Design-for-Test: Chip, Board and System
Design-for-Reliability
Design-for-Yield
Experiments and Case Studies
High-Speed Digital Test
RF Test
Statistical Methods in Test
System-on-Chip Test
System-in-Package Test
Test Methodologies
Test Resource Partitioning

Submissions

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Lecture and Application Series sessions are 90 minutes long. The format is flexible and can consist of from one to three paper presentations. Papers will be reviewed and included in the ITC Proceedings. Lecture and Application Series submissions may cover a single paper or an entire session.

Simply register as an ITC author on the Test Week Web site, http://www.itctestweek.org, and submit your proposal there.

Submissions must include:

Title of paper or session.
Name, affiliation, mailing address, e-mail address, telephone and fax number of each author.
Designation of the presenter(s). ITC will communicate with the presenter(s).
An electronic copy of a one- or two-page extended summary of the proposed paper or session.

Please note that the submission deadline is firm.

Submission Deadline: February 18, 2005

Organizer Notification: May 15, 2005

Manuscript Deadline: July 15, 2005

All submissions and presentations must be in electronic format. Prospective authors must read the detailed instructions regarding formats and submission requirements that are available on the ITC Web page at: http://www.itctestweek.org

Contacts

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For further information, check the ITC Web page or contact:

International Test Conference
Washington, D.C., USA
Tel: +1 202.973.8665 Fax: +1 202.331.0111
E-mail: itc@courtesyassoc.com

Program Chair:
Ken Butler, Texas Instruments
E-mail: kenb@ti.com

Lecture and Application Series Coordinator:
Craig Soldat, Agilent Technologies
E-mail: craig_soldat@agilent.com

For more information, visit us on the web at: http://www.itctestweek.org/

INTERNATIONAL TEST CONFERENCE 2005 is sponsored by the IEEE Computer Society and the Institute of Electrical and Electronic Engineers.

CALL FOR PAPERS Lecture Series and Application Series
Overview -- Submissions -- Contacts
Overview	top
International Test Conference is the world's premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. This year, ITC will focus on evolutionary as well as revolutionary trends in test technology. Evolving new "out-of-the-box" ideas to meet the tough test challenges presented by very-deep-submicron technologies and the competition for dominance among alternative solutions. Recent advances in areas such as on-chip compression, low-cost test, and test data analysis have burst onto the scene and are being rapidly and widely adopted. Submissions for the Lecture Series should emphasize topics are new and at the leading edge of technology—currently topical or heavily debated topics that are important to the testing industry. The purpose of the Application Series is to cover test application topics using an embedded tutorial format. The topics presented should be based on experience and should provide a practical coverage of the topic. Participation is encouraged from individuals who have a practical knowledge of the topic based on experience. Possible Lecture and Application Series Topic Areas: BIST or Embedded Test for Chip and Board Board and System Test Loadboard Design and Tester Interfacing Simulation and Test Design-for-Test: Chip, Board and System Design-for-Reliability Design-for-Yield Experiments and Case Studies High-Speed Digital Test RF Test Statistical Methods in Test System-on-Chip Test System-in-Package Test Test Methodologies Test Resource Partitioning
Submissions	top
Lecture and Application Series sessions are 90 minutes long. The format is flexible and can consist of from one to three paper presentations. Papers will be reviewed and included in the ITC Proceedings. Lecture and Application Series submissions may cover a single paper or an entire session. Simply register as an ITC author on the Test Week Web site, http://www.itctestweek.org, and submit your proposal there. Submissions must include: Title of paper or session. Name, affiliation, mailing address, e-mail address, telephone and fax number of each author. Designation of the presenter(s). ITC will communicate with the presenter(s). An electronic copy of a one- or two-page extended summary of the proposed paper or session. Please note that the submission deadline is firm. Submission Deadline: February 18, 2005 Organizer Notification: May 15, 2005 Manuscript Deadline: July 15, 2005 All submissions and presentations must be in electronic format. Prospective authors must read the detailed instructions regarding formats and submission requirements that are available on the ITC Web page at: http://www.itctestweek.org
Contacts	top
For further information, check the ITC Web page or contact: International Test Conference Washington, D.C., USA Tel: +1 202.973.8665 Fax: +1 202.331.0111 E-mail: itc@courtesyassoc.com Program Chair: Ken Butler, Texas Instruments E-mail: kenb@ti.com Lecture and Application Series Coordinator: Craig Soldat, Agilent Technologies E-mail: craig_soldat@agilent.com
For more information, visit us on the web at: http://www.itctestweek.org/
INTERNATIONAL TEST CONFERENCE 2005 is sponsored by the IEEE Computer Society and the Institute of Electrical and Electronic Engineers.